Numerical parasitic reactances at the interface between FDTD mesh and lumped elements

IEEE MTT-S International Microwave Symposium Digest

Volumn 4, Issue , 1999, Pages 1585-1588

  Borzetta, L ^a   Alimenti, F ^a   Ciampolini, P ^a   Mezzanotte, P ^a   Roselli, L ^a   Sorrentino, R ^a  

^a UNIVERSITY OF PERUGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; ESTIMATION; FINITE DIFFERENCE METHOD; MATHEMATICAL MODELS; TIME DOMAIN ANALYSIS;

FINITE DIFFERENCE TIME DOMAIN METHOD; LUMPED ELEMENT; PARASITIC REACTANCES;

MICROWAVE DEVICES;

EID: 0033362847     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)