THz imaging via electro-optic effect

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1999, Pages 941-944

  Jiang, Zhiping ^a   Zhang, X C ^a  

^a ZOmega Technology Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICE SYSTEM; POINT SCANNING SYSTEM; SPATIO TEMPORAL CHIRPED PULSE IMAGING SYSTEM; TERAHERTZ IMAGING; UNIFORMITY;

ABERRATIONS; CHARGE COUPLED DEVICES; ELECTROOPTICAL EFFECTS; OPTICAL RESOLVING POWER; SCANNING; SENSITIVITY ANALYSIS; SIGNAL DETECTION; SIGNAL TO NOISE RATIO;

IMAGING SYSTEMS;

EID: 0033362744     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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