Simple transient extension chamber to permit full mass scans with electrothermal vaporization inductively coupled plasma mass spectrometry

Applied Spectroscopy

Volumn 53, Issue 10, 1999, Pages 1244-1250

  Langer, Delony ^a   Holcombe, James A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PLASMA APPLICATIONS; TRACE ANALYSIS; TRACE ELEMENTS; VAPORIZATION;

ELECTROTHERMAL VAPORIZERS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (ICP-MS);

MASS SPECTROMETRY;

EID: 0033362507     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702991945489     Document Type: Article

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5. D. Langer and J. A. Holcombe, Anal. Chem. 71, 582 (1999).
6. C. M. Sparks, T. L. Pinkston, and J. A. Holcombe, Spectrochim. Acta, Part B 48, 1607 (1993).