Microscopic image analysis of defect areas in optical disks

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3806, Issue , 1999, Pages 106-112

  L'Hostis, Pierre ^a   Byers, Frederick ^a   Podio, Fernando ^a   Tang, Xiao ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; NONDESTRUCTIVE EXAMINATION; OPTICAL MICROSCOPY; QUALITY CONTROL;

DIGITAL VERSATILE DISKS (DVD); MEDIA DEFECTS ANALYSIS;

OPTICAL DISK STORAGE;

EID: 0033361697     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)