A new robust method for six-port reflectometer calibration

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 5, 1999, Pages 927-931

  Wiedmann, Frank ^a,b   Huyart, Bernard ^a,c   Bergeault, Eric ^a,c   Jallet, Louis ^c  

^a IEEE   (Germany)

^b Texas Instruments Deutschland GmbH   (Germany)

^c TELECOM PARISTECH   (France)

Author keywords

Calibration procedure; Network analysis; Reflection coefficient measurement; S parameter measurement; Six port reflectometer

Indexed keywords

ALGORITHMS; CALIBRATION; ELECTRIC NETWORK ANALYSIS; PARAMETER ESTIMATION; REFLECTOMETERS; SEMICONDUCTING GALLIUM ARSENIDE;

ENGEN SIX-PORT-TO-FOUR-PORT REDUCTION ALGORITHMS; REFLECTION COEFFICIENT MEASUREMENTS;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0033361659     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.799649     Document Type: Article

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