Use of a neural factory to investigate the effect of product line width on manufacturing performance

Management Science

Volumn 45, Issue 11, 1999, Pages 1524-1538

  Swamidass, Paul M ^a   Nair, Satish S ^a   Mistry, Sanjay I ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; DATA REDUCTION; MATHEMATICAL MODELS; NEURAL NETWORKS; PRODUCT DEVELOPMENT; RISK MANAGEMENT; SENSITIVITY ANALYSIS;

MANUFACTURING PLANT MODEL; NEURAL FACTORY MODEL; PRODUCT LINE WIDTH;

PRODUCTION CONTROL;

EID: 0033361587     PISSN: 00251909     EISSN: None     Source Type: Journal    
DOI: 10.1287/mnsc.45.11.1524     Document Type: Article

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