Physics-based FET noise model applicable to millimeter-wave frequencies

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 1999, Pages 109-112

  Lee, Daechee ^a   Kwon, Youngwoo ^a   Min, Hong Shick ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; MATHEMATICAL MODELS; MESFET DEVICES; MILLIMETER WAVES; SHORT CIRCUIT CURRENTS; SPURIOUS SIGNAL NOISE; SURFACES;

EQUIPOTENTIAL SURFACE ANALYSIS; FEEDBACK EFFECT; FITTING PARAMETERS; LOW NOISE AMPLIFIERS; NOISE MODEL; SHORT CIRCUIT NOISE CURRENT;

MICROWAVE AMPLIFIERS;

EID: 0033360216     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)