Analysis of interconnections with BCB for high-speed digital applications

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 1999, Pages 205-208

  Umeda, Yohtaro ^a   Osafune, Kazuo ^a   Enoki, Takatomo ^a   Yokoyama, Haruki ^a   Ishii, Yasunobu ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DELAY CIRCUITS; DIELECTRIC FILMS; ELECTRIC RESISTANCE; GATES (TRANSISTOR); HIGH ELECTRON MOBILITY TRANSISTORS; INTEGRATED CIRCUIT LAYOUT; OPTIMIZATION; SEMICONDUCTING INDIUM PHOSPHIDE; SUBSTRATES; TRANSMISSION LINE THEORY;

BENZOCYCLOBUTENE; INTERCONNECTION DELAY; S-PARAMETER MEASUREMENT;

INTEGRATED CIRCUIT TESTING;

EID: 0033359963     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)