Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy

Thin Solid Films

Volumn 354, Issue 1, 1999, Pages 106-110

  Ramm, Matthias ^a   Ata, Masafumi ^a   Brzezinka, Klaus Werner ^b   Gross, Thomas ^b   Unger, Wolfgang ^b  

^a SONY CORPORATION   (Japan)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; AMORPHOUS FILMS; BAND STRUCTURE; ELECTRONIC STRUCTURE; EVAPORATION; RAMAN SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

NEAR-EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY (NEXAFS);

FULLERENES;

EID: 0033359258     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00641-0     Document Type: Article

References (19)

1. M. Ramm, M. Ata, Th. Gross, W. Unger, 1999, unpublished.
2. Gruen D.M., Lui S., Krauss A.R., Pan X.J. Appl. Phys. 75:1994;1758.
3. Maiken E.B., Taborek P. J. Appl. Phys. 78:1995;541.
4. H.G. Busmann, U. Brauneck, H.W. David, S. Dieckhoff, in: Molecular Nanostructures, Proceedings of 11th International Winterschool on Electronic Properties of Novel Materials, Kirchberg, Austria 1997, p. 500.
5. Dresselhaus M.S., Dresselhaus G., Eklund P.C. J. Raman Spectrosc. 27:1996;351.
6. Tamor M.A., Vassell W.C. J. Appl. Phys. 76:1994;3823.
7. M.P. Seah, (Convenor WG2 of SC7), ISO/TC 201/SC7 N23, Draft 2: ISO Standard: Surface chemical analysis - X-ray photoelectron spectrometers - calibration of energy scales, National Physical Laboratory, Teddington, UK, 1996.
8. Tanuma S., Powell C.J., Penn D.R. Surf. Interface Anal. 17:1991;911.
9. Ch. Jung (Ed.), Research at BESSY: A User's Handbook, BESSY, 1993.
10. Batson P.E. Phys. Rev. B. 48:1993;2608.
11. Stöhr J. NEXAFS Spectroscopy. 1992;Springer Verlag, Heidelberg.
12. Vasquez R.P., Brain R.A., Ross D., Yeh N.-C. Surf. Sci. Spec. 1:1992;242.
13. Enkvist Ch., Lunell S., Sjörgen B. Phys. Rev. B. 48:1993;14629.
14. McFeely F.R., Kowalczyk S.P., Ley L., Cavell R.G., Pollak R.A., Shirley D.A. Phys. Rev. B. 9:1974;5268.
15. Weaver J.H., Martins J.L., Komeda T., et al. Phys. Rev. B. 66:1991;1741.
16. Terminello L.J., Shuh D.K., Himpsel F.J., Lapiano-Smith D.A., Stöhr J., Bethune D.S., Meijer G. Chem. Phys. Lett. 182:1991;491.
17. Comelli G., Stöhr J., Robinson C.J., Jark W. Phys. Rev. B. 38:1988;7511.
18. Wesner D., Krummacher S., Carr R., et al. Phys. Rev. B. 28:1983;2152.
19. Knight D.S., Whrite W.B. J. Mater. Res. 4:1989;385.