DEA duality on returns to scale (RTS) in production and cost analyses: An occurrence of multiple solutions and differences between production-based and cost-based RTS estimates

Management Science

Volumn 45, Issue 11, 1999, Pages 1593-1608

  Sueyoshi, Toshiyuki ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; DATA REDUCTION; LINEAR PROGRAMMING; MATHEMATICAL MODELS; PRODUCTION ENGINEERING;

DATA ENVELOPMENT ANALYSIS (DEA); RETURN TO SCALE (RTS) PROCESS;

RISK MANAGEMENT;

EID: 0033358043     PISSN: 00251909     EISSN: None     Source Type: Journal    
DOI: 10.1287/mnsc.45.11.1593     Document Type: Article

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