Behavior of resistors and shunts: With today's high-precision measurement capability and a century of materials experience, what can go wrong?

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 5, 1999, Pages 889-893

  Braudaway, David W ^a,b,c  

^a IEEE

^b SANDIA NATIONAL LABORATORIES   (United States)

^c NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; ELECTRIC RESISTANCE MEASUREMENT; MANGANESE ALLOYS; PRECISION ENGINEERING;

HIGH-PRECISION SHUNTS; RESISTANCE-TEMPERATURE CHARACTERISTICS;

RESISTORS;

EID: 0033358031     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.799641     Document Type: Article

References (4)

1. J. F. Keithley, The Story of Electrical and Magnetic Measurements: From 500 BC to the 1940s: New York: IEEE Press, 1999, pp. 193-202.
2. F. K. Harris, Electrical Measurements. New York: Wiley, 1952, pp. 220-224.
3. G. F. C. Searle, "On resistances with current and potential terminals," Electrician, vol. 66, p. 999, Mar. 1911.
4. D. W. Braudaway, "Temperature characteristics of laboratory resisitors," presented to DOE and Lockheed-Martin Lab. Manag. Groups, Nov. 17, 1995.