Defining SRAM resistive defects and their simulation stimuli

Proceedings of the Asian Test Symposium

Volumn , Issue , 1999, Pages 33-40

  van de Goor, A J ^a   Simonse, J E ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

MEMORY CELL ARRAY FAULTS (MCAF); RESISTIVE DEFECTS; SOFTWARE PACKAGE SPICE; SYNTHETIC RANDOM ACCESS MEMORY (SRAM);

COMPUTER SIMULATION; COMPUTER SOFTWARE; COMPUTER TESTING;

RANDOM ACCESS STORAGE;

EID: 0033357317     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)

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