Refinement of high-resolution X-ray diffraction data in characterizing epitaxial layers and multiple-quantum wells by the peak separation technique

Journal of Crystal Growth

Volumn 207, Issue 3, 1999, Pages 188-199

  Fatemi, M ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; EPITAXIAL GROWTH; ERROR ANALYSIS; LATTICE CONSTANTS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; SEMICONDUCTING FILMS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM WELLS; STRAIN;

X RAY REFLECTION EQUATIONS; X RAY ROCKING CURVES;

X RAY CRYSTALLOGRAPHY;

EID: 0033357288     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00370-X     Document Type: Article

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