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Volumn 46, Issue 1, 1999, Pages 37-45
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Characterizing the uniformity of polystyrene and TPX z-pinch fusion targets by nuclear microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
EMISSION SPECTROSCOPY;
ION BEAMS;
MICROSCOPIC EXAMINATION;
PINCH EFFECT;
PLASMA STABILITY;
POLYSTYRENES;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
TOMOGRAPHY;
TRACE ELEMENTS;
X RAY PRODUCTION;
ION MICROTOMOGRAPHY;
NUCLEAR MICROSCOPY;
PARTICLE-INDUCED X RAY EMISSION (PIXE) SPECTROSCOPY;
SCANNING TRANSMISSION ION MICROSCOPY (STIM);
FUSION REACTIONS;
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EID: 0033356839
PISSN: 09203796
EISSN: None
Source Type: Journal
DOI: 10.1016/S0920-3796(99)00062-9 Document Type: Article |
Times cited : (12)
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References (12)
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