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Volumn 46, Issue 1, 1999, Pages 37-45

Characterizing the uniformity of polystyrene and TPX z-pinch fusion targets by nuclear microscopy

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; ION BEAMS; MICROSCOPIC EXAMINATION; PINCH EFFECT; PLASMA STABILITY; POLYSTYRENES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TOMOGRAPHY; TRACE ELEMENTS; X RAY PRODUCTION;

EID: 0033356839     PISSN: 09203796     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-3796(99)00062-9     Document Type: Article
Times cited : (12)

References (12)
  • 1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.