The Ni(100)(2 × 2)p4g-N reconstruction determined by surface X-ray diffraction

Surface Science

Volumn 433-435, Issue , 1999, Pages 317-321

  Dudzik, E ^a,c   Norris, A G ^a   McGrath, R ^a   Charlton, G ^b   Thornton, G ^b   Murphy, B ^c   Turner, T S ^c   Norman, D ^c  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

^c DARESBURY LABORATORY   (United Kingdom)

Author keywords

Nickel; Nitrogen; Single crystal surfaces; Surface relaxation and reconstruction; X ray scattering

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; NICKEL ALLOYS; RELAXATION PROCESSES; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

PHOTOELECTRON DIFFRACTION; SURFACE EXTENDED X RAY ABSORPTION FINE STRUCTURE; SURFACE RECONSTRUCTION; SURFACE RELAXATION;

SURFACE STRUCTURE;

EID: 0033356572     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00125-9     Document Type: Article

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