Characterization of thick film resistors up to 18 GHz for wireless and RF circuit applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3906, Issue , 1999, Pages 94-99

  Jupina, M A ^a   El Beyrouty, C ^a   Amey, D I ^a   Walker, A T ^a  

^a VILLANOVA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE; ELECTRIC VARIABLES MEASUREMENT; RUTHENIUM COMPOUNDS; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; THICK FILM CIRCUITS;

ELECTRICAL CIRCUIT MODELS; LOW TEMPERATURE COFIRED CERAMICS; PRINTED RESISTOR; RUTHENIUM DIOXIDE; WIRELESS CIRCUITS;

RESISTORS;

EID: 0033356236     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)