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Volumn 2, Issue , 1999, Pages 726-727
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Laser diode linewidth measurement by means of self-mixing interferometry
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
INTERFEROMETRY;
LASER RESONATORS;
LIGHT REFLECTION;
SPURIOUS SIGNAL NOISE;
LASER DIODE LINEWIDTH MEASUREMENT;
SELF-MIXING INTERFEROMETRY;
SEMICONDUCTOR LASERS;
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EID: 0033355975
PISSN: 10928081
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (5)
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