Scattering by randomly rough dielectric surfaces and rough dielectric films: Influence of the height distribution

Journal of Optics A: Pure and Applied Optics

Volumn 1, Issue 4, 1999, Pages 560-565

  Calvo Perez, O ^a   Greffet, J J ^a   Sentenac, A ^b  

^a LABORATOIRE EM2C   (France)

^b Ecole Centrale Marseille   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; DIELECTRIC FILMS; MATHEMATICAL MODELS; OPTICAL CORRELATION; SUBSTRATES; SURFACE ROUGHNESS;

ROOT MEAN SQUARE (RMS); ROUGH DIELECTRIC SURFACES;

LIGHT SCATTERING;

EID: 0033355769     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/1/4/324     Document Type: Article

References (12)

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