Ribbon-Wire Interconnect Using Parasitic Element

IEICE Transactions on Electronics

Volumn E82-C, Issue 4, 1999, Pages 662-664

  Izumi, Hajime ^a,b,c   Arai, Hiroyuki ^a   Itoh, Tatsuo ^a  

^a KISARAZU NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^b YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Dc break; Electromagnetic coupling; Fdtd method; Interconnect; Parasitic element; Ribbon wire bonding

Indexed keywords

ELECTROMAGNETIC FIELD THEORY; ELECTRONICS PACKAGING; FINITE DIFFERENCE METHOD; MICROSTRIP LINES; RESONATORS; TIME DOMAIN ANALYSIS;

CONTACT LENS CONNECTOR; DC BREAK STRUCTURE; ELECTROMAGNETIC COUPLING; PARASITIC ELEMENT; RIBBON WIRE INTERCONNECT;

DIELECTRIC MATERIALS;

EID: 0033355671     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (2)

1. H.Arai and T.Itoh, APMC97, pp.1133-1136, Dec. 1997.
2. E.Yamashita and Y.Qian, "FDTD analysis of microwave planar circuits," Realize Inc., 1996.