Investigation of arc roots of constricted high current vacuum arcs

IEEE Transactions on Plasma Science

Volumn 27, Issue 4, 1999, Pages 954-960

  Haas, Wilfried ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CATHODES; CURRENT DENSITY; ELECTRIC CONTROL EQUIPMENT; MAGNETIC FIELD EFFECTS; TEMPERATURE; VACUUM TECHNOLOGY; VIDEO CAMERAS;

ARC DISCHARGES; VACUUM ARCS; VACUUM CIRCUIT BREAKERS; VACUUM INTERRUPTERS;

ELECTRIC ARCS;

EID: 0033354225     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.782266     Document Type: Article

References (14)

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