Radiation evaluation of plastic encapsulated transistors and microcircuits for use in space applications

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1999, Pages 102-107

  Gorelick, J L ^a   McClure, S S ^a   Swink, C ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; MICROELECTRONICS; RADIATION EFFECTS; SATELLITES; SPACE APPLICATIONS; TRANSISTORS;

PLASTIC ENCAPSULATED MICROCIRCUITS; RADIATION TESTING;

ELECTRONICS PACKAGING;

EID: 0033354076     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)