Comparison of depth profiling analysis of a thick, electrolytically-coloured porous alumina film by EPMA and GDOES

Surface and Interface Analysis

Volumn 27, Issue 12, 1999, Pages 1046-1049

  Shimizu, K ^a   Habazaki, H ^b   Skeldon, P ^c   Thompson, G E ^c   Wood, G C ^c  

^a KEIO UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; EMISSION SPECTROSCOPY; GLOW DISCHARGES; MICROANALYSIS; NICKEL; POROUS MATERIALS; THICK FILMS; TRANSMISSION ELECTRON MICROSCOPY;

DEPTH PROFILING; ELECTRON PROBE MICROANALYSIS (EPMA); GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY (GDOES);

ALUMINA;

EID: 0033353322     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199912)27:12<1046::AID-SIA673>3.0.CO;2-X     Document Type: Article

References (8)

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7. Shimizu K, Habazaki H, Skeldon P, Thompson GE, Wood GC. Surf. Interface Anal. 1999; 27: 950.
8. Shimizu K, Habazaki H, Skeldon P, Thompson GE, Wood GC. Surf. Interface Anal. 1999; 27: 998.