Impact of simulation parameters on critical area analysis

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 1999, Pages 14-19

  Segal, Julie ^a   Bakarian, Sergei ^a   Ross, Ron ^a  

^a HPL Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL DEFECTS; ELECTRIC CONTACTS; MONTE CARLO METHODS; RANDOM ACCESS STORAGE;

CRITICAL AREA ANALYSIS; STATIC RANDOM ACCESS MEMORY (SRAM);

INTEGRATED CIRCUIT LAYOUT;

EID: 0033353251     PISSN: 10636722     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)