In situ observation of indium nanoparticles deposited on Si thin films by ultrahigh vacuum field emission transmission electron microscope

Surface Science

Volumn 433, Issue , 1999, Pages 491-495

  Tanaka, Miyoko ^a   Takeguchi, Masaki ^a   Furuya, Kazuo ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; HIGH RESOLUTION ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; SILICON; SINGLE CRYSTALS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

MULTIPLY TWINNED PARTICLE; STRUCTURAL TRANSITION; ULTRAHIGH VACUUM TRANSMISSION ELECTRON MICROSCOPE;

INDIUM;

EID: 0033353209     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00483-5     Document Type: Article

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