Soft X-ray fluorescence measurements of polyimide films

Thin Solid Films

Volumn 357, Issue 2, 1999, Pages 91-97

  Winarski, R P ^a   Ederer, D L ^a   Kurmaev, E Z ^b   Shamin, S N ^b   Endo, K ^c   Ida, T ^c   Moewes, A ^d   Chang, G S ^e   Kim, S Y ^e   Whang, C N ^e  

^a Tulane University   (United States)

^b INSTITUTE OF METAL PHYSICS   (Russian Federation)

^c KANAZAWA UNIVERSITY   (Japan)

^d LOUISIANA STATE UNIVERSITY   (United States)

^e Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; FLUORESCENCE; IONIZATION; PLASTIC COATINGS; POLYIMIDES; SILICON; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

IONIZED CLUSTER BEAM DEPOSITION (ICBD); SOFT X RAY FLUORESCENCE MEASUREMENT;

PLASTIC FILMS;

EID: 0033352678     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00423-X     Document Type: Article

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