Derivation of BRDF from smooth surface topography of large AFM scans - investigation of the influences of surface figures and AFM artefacts

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3784, Issue , 1999, Pages 166-174

  Rothe, Hendrik ^a   Hueser, Dorothee ^a   Kasper, Andre ^a   Rinder, Thomas ^a  

^a HELMUT SCHMIDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; DEFECTS; LIGHT SCATTERING; OPTICAL SENSORS; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY;

BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION; MICROROUGHNESS; RAYLEIGH-RICE APPROXIMATION;

ATOMIC FORCE MICROSCOPY;

EID: 0033352140     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)