Potential distribution measurement of positive surface streamer by using pockels device

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 1, Issue , 1999, Pages 150-153

  Kumada, A ^a   Chiba, M ^a   Hidaka, K ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ELECTRONIC EQUIPMENT; ION BEAMS; STREAK CAMERAS; SURFACE DISCHARGES; VOLTAGE DISTRIBUTION MEASUREMENT;

POCKELS DEVICE; POSITIVE SURFACE STREAMER;

DIELECTRIC MATERIALS;

EID: 0033352104     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)