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Volumn , Issue , 1999, Pages 48-53
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Determining redundancy requirements for memory arrays with critical area analysis
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
ERRORS;
KNOWLEDGE BASED SYSTEMS;
MICROPROCESSOR CHIPS;
PROBABILITY;
RANDOM ACCESS STORAGE;
REDUNDANCY;
STATISTICAL METHODS;
BITMAP SIGNATURES;
CRITICAL AREA ANALYSIS;
INLINE DEFECT DATA;
MEMORY ARRAYS;
MEMORY DESIGN;
POISSON STATISTICS;
RULE BASED ALGORITHMS;
CELLULAR ARRAYS;
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EID: 0033350201
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (19)
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References (5)
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