Comparison between fully- and partially-depleted SOI MOSFET's for low-power radio-frequency applications

IEEE International SOI Conference

Volumn , Issue , 1999, Pages 22-23

  Rozeau, O ^a   Jomaah, J ^a   Boussey, J ^a   Raynaud, C ^a   Pelloie, J L ^a   Balestra, F ^a  

^a LPCS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS;

SALICIDE PROCESSES;

MOSFET DEVICES;

EID: 0033349875     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)