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Volumn 57, Issue 4, 1999, Pages 637-659

Electrodiffusional free boundary problem, in a bipolar membrane (semiconductor diode), at a reverse bias for constant current

Author keywords

[No Author keywords available]

Indexed keywords

IONS; PERTURBATION TECHNIQUES; PROBLEM SOLVING; SEMICONDUCTOR DIODES;

EID: 0033348523     PISSN: 0033569X     EISSN: None     Source Type: Journal    
DOI: 10.1090/qam/1724297     Document Type: Article
Times cited : (4)

References (11)
  • 1
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    • Electrodiffusional free boundary problem in concentration polarization in electrodialysis
    • I. Rubinstein and B. Zaltzman, Electrodiffusional free boundary problem in concentration polarization in electrodialysis, Math. Models Methods Appl. Sci. 6, 623-648 (1996)
    • (1996) Math. Models Methods Appl. Sci. , vol.6 , pp. 623-648
    • Rubinstein, I.1    Zaltzman, B.2
  • 3
    • 33747036921 scopus 로고
    • Strong electric field effects on proton transfer between membrane-bound amins and water
    • R. Simons, Strong electric field effects on proton transfer between membrane-bound amins and water, Nature 280, 824 (1979)
    • (1979) Nature , vol.280 , pp. 824
    • Simons, R.1
  • 4
    • 0023823986 scopus 로고
    • Aquatech membrane technology for recovery of acid/base values from salt streams
    • K. N. Mani, F. P. Chlanda, and C. H. Byszewski, Aquatech Membrane Technology for Recovery of Acid/Base Values from Salt Streams, Desalination 68, 149-166 (1988)
    • (1988) Desalination , vol.68 , pp. 149-166
    • Mani, K.N.1    Chlanda, F.P.2    Byszewski, C.H.3
  • 6
    • 0343859878 scopus 로고
    • Mathematical properties of one-dimensional semi-conductors
    • F. Brezzi and L. Gastaldi, Mathematical properties of one-dimensional semi-conductors, Math. Appl. Comp. 5, 123-137 (1986)
    • (1986) Math. Appl. Comp. , vol.5 , pp. 123-137
    • Brezzi, F.1    Gastaldi, L.2
  • 7
    • 0000844712 scopus 로고
    • A singular perturbation analysis of reverse-biased semiconductor diodes
    • F. Brezzi, A. C. Capelo, and L. Gastaldi, A singular perturbation analysis of reverse-biased semiconductor diodes, SIAM J. Math. Anal. 20, 372-387 (1989)
    • (1989) SIAM J. Math. Anal. , vol.20 , pp. 372-387
    • Brezzi, F.1    Capelo, A.C.2    Gastaldi, L.3
  • 8
    • 0009452727 scopus 로고
    • A singular perturbation problem for semi-conductors
    • L. A. Caffarelli and A. Friedman, A singular perturbation problem for semi-conductors, Bolletino Un. Mat. Ital. B (7) 1, 409-421 (1987)
    • (1987) Bolletino Un. Mat. Ital. B , vol.1 , Issue.7 , pp. 409-421
    • Caffarelli, L.A.1    Friedman, A.2
  • 9
    • 0009443059 scopus 로고
    • A singular perturbation analysis of reverse based pn-junctions
    • C. Schmeiser, A singular perturbation analysis of reverse based pn-junctions, SIAM J. Math. Anal. 21, 313-326 (1990)
    • (1990) SIAM J. Math. Anal. , vol.21 , pp. 313-326
    • Schmeiser, C.1
  • 10
    • 0000608193 scopus 로고
    • On the Stefan problem
    • in Russian
    • S. L. Kamenomostskaya, On the Stefan problem, Math. Sb. (N.S.) 53, 489-514 (1961) (in Russian)
    • (1961) Math. Sb. (N.S.) , vol.53 , pp. 489-514
    • Kamenomostskaya, S.L.1
  • 11
    • 0000859294 scopus 로고
    • A method of solutions of the general Stefan problem
    • O. A. Oleinik, A method of solutions of the general Stefan problem, Soviet Math. Dokl. 1, 1350-1354 (1960)
    • (1960) Soviet Math. Dokl. , vol.1 , pp. 1350-1354
    • Oleinik, O.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.