Microwave properties of an integrated thick film and tape technology to 40 GHz

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3906, Issue , 1999, Pages 84-88

  Free, Charles ^a   Barnwell, Peter ^a   Aitchison, Colin ^a   Robertson, Ian ^a  

^a MIDDLESEX UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ELECTROMAGNETIC DISPERSION; ELECTROMAGNETIC WAVE ATTENUATION; MICROWAVE CIRCUITS; PERMITTIVITY; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SURFACE ROUGHNESS; WIRELESS TELECOMMUNICATION SYSTEMS;

LOW TEMPERATURE COFIRED CERAMICS; MICROWAVE PROPERTIES;

THICK FILM CIRCUITS;

EID: 0033348347     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)