Ballistic nano-transistor

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 55-58

  Timp, G ^a   Bude, J ^a   Bourdelle, K K ^a   Garno, J ^a   Ghetti, A ^a   Gossmann, H ^a   Green, M ^a   Forsyth, G ^a   Kim, Y ^a   Kleiman, R ^a   Klemens, F ^a   Kornblit, A ^a   Lochstampfor, C ^a   Mansfield, W ^a   Moccio, S ^a   et al , ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON TRANSPORT PROPERTIES; GATES (TRANSISTOR); LEAKAGE CURRENTS; MICROSCOPIC EXAMINATION; MONTE CARLO METHODS; SEMICONDUCTOR DEVICE MANUFACTURE; THRESHOLD VOLTAGE;

BALLISTIC NANOTRANSISTOR; BALLISTIC TRANSPORT; SCANNING CAPACITANCE MICROSCOPY; SOFTWARE PACKAGE PROPHET; TRANSMISSION PROBABILITY; TRANSMITTANCE;

MOSFET DEVICES;

EID: 0033347297     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)