Eigenvalue parameters for surface roughness studies

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3754, Issue , 1999, Pages 2-13

  Cloude, Shane R ^a  

^a Applied Electromagnetics   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; ENTROPY; LIGHT POLARIZATION; LIGHT SCATTERING; OPTICAL VARIABLES MEASUREMENT; POLARIMETERS; STATISTICAL METHODS;

MUELLER MATRIX FILTERING; PARTICLE SCATTERING; SCATTERING ENTROPY; SCATTERING POLARIMETRY;

SURFACE ROUGHNESS;

EID: 0033347233     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)