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Volumn 3782, Issue , 1999, Pages 510-517

Surface figure and roughness tolerances for NIF optics and the interpretation of the gradient, P-V wavefront and RMS specifications

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; LASERS; OPTICAL SYSTEMS; OPTICAL TESTING; QUALITY ASSURANCE; SPECIFICATIONS; STANDARDS; WAVEFRONTS;

EID: 0033347113     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (40)

References (7)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.