Test process optimization: closing the gap in the defect spectrum

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 124-129

  Barrett, Norma ^a   Martin, Simon ^a   Dislis, Chryssa ^a  

^a MOTOROLA   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

CELLULAR TELEPHONE SYSTEMS; COMPUTER SIMULATION; COMPUTER SOFTWARE; DEFECTS; GRAPHICAL USER INTERFACES; RELIABILITY;

DEFECT SPECTRUM; SOFTWARE TESTING TUNING MODEL;

ELECTRONIC EQUIPMENT TESTING;

EID: 0033346871     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)