CZT pixel-detectors equipped with effective Ohmic contacts; Their spectroscopic performance and the enigma of why they thus behave

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 2-14

  El Hanany, Uri ^a   Shahar, A ^a   Tsigelman, A ^a  

^a Imarad Imaging Systems Ltd   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; GAMMA RAY SPECTROMETERS; OHMIC CONTACTS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR GROWTH;

BRIDGMAN METHOD; CADMIUM ZINC TELLURIDE; NUCLEAR SPECTROMETERS; PIXEL DETECTORS; SEMICONDUCTOR DETECTORS;

RADIATION DETECTORS;

EID: 0033346797     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366605     Document Type: Conference Paper

References (13)