New method of predicting the frictional property using AFM

American Society of Mechanical Engineers, Tribology Division, TRIB

Volumn 9, Issue , 1999, Pages 61-65

  Kurihara, Ken'ichi ^a   Kishii, Noriyuki ^a   Kamei, Takahiro ^a   Kobayashi, Ken ^a   Iwamoto, Yutaka ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVES; ATOMIC FORCE MICROSCOPY; CARBON; FRICTION; INTERFACES (MATERIALS); LUBRICANTS; MAGNETIC DISK STORAGE; MAGNETIC HEADS; MAGNETIC RECORDING; MAGNETIC TAPE; MATHEMATICAL MODELS; PROTECTIVE COATINGS;

ADHESIVE FORCE; CARBON PROTECTIVE LAYERS; CRITICAL STANDARD DEVIATIONS;

TRIBOLOGY;

EID: 0033346527     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

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