Value of tester accuracy

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 518-523

  Dalal, Wajih ^a   Miao, Song ^a  

^a SCHLUMBERGER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER SIMULATION; DYNAMIC RANDOM ACCESS STORAGE; MICROPROCESSOR CHIPS; PROBABILITY DISTRIBUTIONS;

DEFECT PER MILLION; EDGE PLACEMENT ACCURACY; OVERALL TIMING ACCURACY;

ELECTRONIC EQUIPMENT TESTING;

EID: 0033345799     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)