Characterisation of surfaces using neural pattern recognition methods based on BRDF and AFM measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3784, Issue , 1999, Pages 132-146

  Rinder, Thomas ^a   Rothe, Hendrik ^a  

^a HELMUT SCHMIDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT SCATTERING; PHOTODIODES; SILICON SENSORS; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY;

NEURAL PATTERN RECOGNITION; SURFACE PARAMETER IDENTIFICATION;

PATTERN RECOGNITION;

EID: 0033345773     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)