Effects of charge state on stress-induced alignment and relaxation of a hydrogen-carbon complex in silicon

Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 184-187

  Fukuda, K ^a   Kamiura, Y ^a   Yamashita, Y ^a  

^a OKAYAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; COMPRESSIVE STRESS; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC CHARGE; HYDROGEN BONDS; MOLECULAR DYNAMICS; MOLECULAR ORIENTATION; RELAXATION PROCESSES;

MOLECULAR RELAXATION;

SEMICONDUCTING SILICON;

EID: 0033344438     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00441-X     Document Type: Article

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