Quantitative evaluation of glass-forming impurities in alumina: equivalent silica concentration (ESC)

Journal of the American Ceramic Society

Volumn 82, Issue 8, 1999, Pages 2233-2238

  Yoo, Jung Ho ^a   Nam, Jong Chul ^a   Baik, Sunggi ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC SPECTROSCOPY; CHEMICAL OPERATIONS; CRYSTAL IMPURITIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; MASS SPECTROMETRY; MICROANALYSIS; SILICA; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC ABSORPTION SPECTROMETRY; EQUIVALENT SILICA CONCENTRATION; GLOW DISCHARGE MASS SPECTROMETRY; INDUCTIVELY COUPLED PLASMA SPECTROMETRY; SPARK SOURCE MASS SPECTROMETRY; ULTRAPURE ALUMINA; X RAY FLUORESCENCE SPECTROMETRY;

ALUMINA;

EID: 0033344204     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1999.tb02067.x     Document Type: Article

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