High-temperature mechanical characterization of single-crystal sapphire using laser-based ultrasonics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3705, Issue , 1999, Pages 51-59

  Blodgett, D W ^a   Baldwin, K C ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; HEAT RESISTANCE; HIGH TEMPERATURE TESTING; INFRARED RADIATION; LASER APPLICATIONS; NONDESTRUCTIVE EXAMINATION; SAPPHIRE; SINGLE CRYSTALS; TEMPERATURE; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL EXPANSION; ULTRASONIC APPLICATIONS;

INFRARED TRANSPARENT WINDOWS; LASER BASED ULTRASONICS; SINGLE CRYSTAL SAPPHIRE; THERMAL SHOCK RESISTANCE;

OPTICAL MATERIALS;

EID: 0033343553     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)