SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 560, Issue , 1999, Pages 239-243

High field limitation of Poole-Frenkel emission caused by tunneling

(5) Ganichev, S D a,b Ziemann, E a Prettl, W a Istratov, A A c Weber, E R c

a UNIVERSITY OF REGENSBURG (Germany)

b IOFFE INSTITUTE (Russian Federation)

c UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC FIELD EFFECTS; ELECTRON EMISSION; ELECTRON TUNNELING; PHONONS;

CARRIER EMISSION; CHARGED IMPURITIES; EMISSION RATE; PHONON ASSISTED TUNNELING; POOLE-FRENKEL EMISSION; STATIC ELECTRIC FIELDS; TERAHERTZ ELECTRIC FIELDS;

SEMICONDUCTOR MATERIALS;

EID: 0033343383 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-560-239 Document Type: Conference Paper

Times cited : (5)

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