Evolution of a system test process

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 680-688

  Martin, Simon ^a   Bleck, Robert ^a   Dislis, Chryssa ^a   Farren, Des ^a  

^a MOTOROLA   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; LARGE SCALE SYSTEMS; PROCESS ENGINEERING; PRODUCT DESIGN; QUALITY ASSURANCE; RELIABILITY; SOCIETIES AND INSTITUTIONS;

GLOBAL SYSTEM FOR MOBILE; GSM SYSTEMS DIVISION; MOTOROLA; TEST ORGANIZATIONS;

PRODUCT DEVELOPMENT;

EID: 0033343251     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)