Thin film electrodes for trace metal analysis by d.c. resistance changes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3857, Issue , 1999, Pages 135-143

  Schoening, Michael J ^a   Glueck, Olaf ^a   Kordos, Peter ^a   Lueth, Hans ^a   Emons, Hendrik ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM; ELECTROCHEMICAL ELECTRODES; GOLD; LEAD; MICROSENSORS; NICKEL; SEMICONDUCTING SILICON; THALLIUM; THIN FILM DEVICES; TRACE ANALYSIS; ZINC;

STRIPPING METHOD; THIN FILM ELECTRODES;

ELECTROCHEMICAL SENSORS;

EID: 0033343196     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)