High frequency characterization of SOI dynamic threshold voltage MOS (DTMOS) transistors

IEEE International SOI Conference

Volumn , Issue , 1999, Pages 24-25

  Ferlet Cavrois, V ^a   Bracale, A ^a   Fel, Nicolas ^a   Musseau, O ^a   Raynaud, C ^a   Faynot, O ^a   Pelloie, J L ^a  

^a CEA DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LITHOGRAPHY; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; THRESHOLD VOLTAGE; TRANSCONDUCTANCE;

DYNAMIC THRESHOLD VOLTAGE METAL OXIDE SEMICONDUCTOR TRANSISTORS;

MOSFET DEVICES;

EID: 0033343179     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)