End-stopped wavelets for detecting low-level features

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3813, Issue , 1999, Pages 732-741

  Bhattacharjee, Sushil K ^a   Vandergheynst, Pierre ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CELLS; COMPUTER SIMULATION; DIGITAL FILTERS; EDGE DETECTION; FREQUENCY DOMAIN ANALYSIS; IMAGE ANALYSIS; PROBLEM SOLVING; WAVELET TRANSFORMS;

END STOPPED WAVELETS; MORLET WAVELETS; SCALE SPACE BEHAVIOR; TWO DIMENSIONAL CONTINUOUS WAVELETS;

FEATURE EXTRACTION;

EID: 0033342928     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)