Relating linearity test results to design flaws of pipelined analog to digital converters

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 772-779

  Kuyel, Turker ^a   Bilhan, Haydar ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CAPACITORS; ERROR ANALYSIS; INTEGRATED CIRCUIT LAYOUT; SIMULATION; SWITCHING NETWORKS;

AUTOMATIC TESTING EQUIPMENT; DIFFERENTIAL NONLINEARITY; INTEGRAL NONLINEARITY; LINEARITY ERRORS; SAMPLE AND HOLD CIRCUITS; SWITCHED CAPACITOR;

INTEGRATED CIRCUIT TESTING;

EID: 0033342552     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)