Embedded core DFT scheme to obtain highly compressed test sets

Proceedings of the Asian Test Symposium

Volumn , Issue , 1999, Pages 275-280

  Jas, Abhijit ^a   Mohanram, Kartik ^a   Touba, Nur A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGHLY COMPRESSED TEST SETS;

BUILT-IN SELF TEST; DESIGN FOR TESTABILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0033341654     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)

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