Analysis of IC fabrication processes using Self-Organizing Maps

IEE Conference Publication

Volumn 2, Issue 470, 1999, Pages 631-636

  Rueping, S ^a   Mueller, J ^a  

^a UNIVERSITY OF PADERBORN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; INTEGRATED CIRCUIT MANUFACTURE; SENSORS;

SELF-ORGANIZING MAPS (SOM);

NEURAL NETWORKS;

EID: 0033340183     PISSN: 05379989     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)